Author: Sivakumar Alagumalai
Date: 15 Feb 2005
Publisher: Springer-Verlag New York Inc.
Language: English
Book Format: Hardback::360 pages
ISBN10: 140203072X
Publication City/Country: New York, NY, United States
File size: 30 Mb
Filename: applied-rasch-measurement-a-book-of-exemplars-papers-in-honour-of-john-p.-keeves.pdf
Dimension: 155x 235x 22.35mm::1,560g
Download Link: Applied Rasch Measurement: A Book of Exemplars : Papers in Honour of John P. Keeves
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